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KIC is proud to announce that the KIC 24/7 was awarded the 2001 SMT Vision Award in the software category at APEX 2002. The Vision Award for the 24/7 is KIC's second consecutive award and third win in four years. The KIC 24/7 automated reflow management system enables users to increase manufacturing efficiencies by automating process development and control. The system combines continuous SPC charting, line balancing, documentation, and production traceability into one software package, adding a new level of automation to the thermal process. The KIC 24/7 automatically provides real-time process data to engineers and managers, allowing them to make critical decisions affecting production costs and quality. And the KIC 24/7 includes a zero-defect fail-safe system that alarms before the process drifts out-of-spec. Process data is automatically charted for all critical process specs: peak temperature, soak time, time above liquidus, etc. The data is plotted on real-time control charts and Process Capability (Cpk) is calculated for each spec. Any process drift outside of the control limits will bring an immediate alarm. This allows the 24/7 to automatically catch potential defects before they happen, rather than discovering actual defects in "Inspection". The KIC 24/7 automatically calculates and records a unique product profile including all process data for every product that exits the oven. In 1998, KIC's Auto-Predict won, as did the KIC-Pilot self-profiling oven software in 2000. The Vision Awards, presented annually by SMT Magazine, recognize companies that have uniquely advanced surface mount technology or demonstrated "visionary" development of new products to meet the challenges facing the electronics assembly industry. KIC -- Innovation That Works
EP&P
Magazine Announces 11th Annual Excellence Awards Winners 11th Annual
EP&P Excellence in Electronic Packaging and Production Awards Winners
and Finalists
The program was open for entries in the following categories: Adhesives, Coatings and Encapsulants; Assembly Tools; Cleaning; Components; Contract Services; Dispensing Equipment; Inspection; Pick-and-Place Systems; Printing; Rework and Repair; Software; Soldering Equipment; Soldering Materials; and Testing. Only those products introduced between January 1 and December 31, 2001, qualified for the 2001 program. A panel of industry experts judged each submission based on its ability to meet a significant industry challenge, creative application of a new or existing technology, overall quality and consistency of performance, economic merits, and throughput characteristics. Additionally, the products were judged specifically on their innovativeness, cost-effectiveness, speed and throughput improvements, quality contribution, ease of use, maintainability and repairability, and environmental responsibility. Each of the winning companies received a crystal display award and will be featured in the VISION Awards spotlight in the March 2002 issue of SMT Magazine.
phoenix|xray, 2 years in the Xray inspection and failure analysis industry, received top honors for service in the Test and Inspection category of Electronics Assembly Equipment Suppliers. Evaluated by an independent third party forum, the company excelled in key categories determining excellence in service from interviews with 15 customers from each entrant. Customers rated the entrants on a scale of 1 to 5, 5 being superior, in areas of dependability, ease of use, responsiveness, technology and value for the price scoring high marks. Its an incredible feeling to be evaluated by your own customers, said Jeff Mirliss, phoenix|xrays customer service manager, and have no say or influence on what they have to say and then come out on top. Its a definite testament to what we set out to achieve just over two years ago. Through our continued can do customer relationship and the introduction of such breakthrough technologies as our nanofocus xray system, we will only get better. Also a premiere for the company, phoenix|xray introduced at the show their nanofocus X-ray tube capable of obtaining images down to 0.5 micrometers (500 nanometers), small enough to sharply and clearly image microvias. It is the first of its kind available commercially to the market. Also introduced at the show is the companys new x-ray inspection system that fills the void between fast automated inline and offline semi-automatic or manual failure analysis systems, the pcba|sentry. The new system is a fully automated microfocus X-ray system for the inspection and failure analysis of area array packages providing powerful BGA and µBGA image analysis by repeatedly determining opens and wetting errors instantly at known levels of confidence, making it the first system of its kind. |
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